• DocumentCode
    985848
  • Title

    Reliability Bounds for Multi-State k -out-of- n Systems

  • Author

    Tian, Zhigang ; Yam, Richard C M ; Zuo, Ming J. ; Huang, Hong-Zhong

  • Author_Institution
    Univ. of Alberta, Edmonton
  • Volume
    57
  • Issue
    1
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    53
  • Lastpage
    58
  • Abstract
    Algorithms have been available for exact performance evaluation of multi-state k-out-of-n systems. However, especially for complex systems with a large number of components, and a large number of possible states, obtaining "reliability bounds" would be an interesting, significant issue. Reliability bounds will give us a range of the system reliability in a much shorter computation time, which allow us to make decisions more efficiently. The systems under consideration are multi-state k-out-of-n systems with i.i.d. components. We will focus on the probability of the system in states below a certain state d, denoted by Qsd. Based on the recursive algorithm proposed by Zuo & Tian [14] for performance evaluation of multi-state k-out-of-n systems with i.i.d. components, a reliability bounding approach is developed in this paper. The upper, and lower bounds of Qsd are calculated by reducing the length of the k vector when using the recursive algorithm. Using the bounding approach, we can obtain a good estimate of the exact Qsd value while significantly reducing the computation time. This approach is attractive, especially to complex systems with a large number of components, and a large number of possible states. A numerical example is used to illustrate the significance of the proposed bounding approach.
  • Keywords
    performance evaluation; probability; reliability theory; complex systems; multi state k out of n systems; performance evaluation; probability; system reliability; $k$-out-of-$n$ systems; Bound; multi-state; recursive algorithm;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2007.909766
  • Filename
    4387788