DocumentCode :
986029
Title :
A reliability and cost analysis of an automatic prototype generator test paradigm
Author :
Maghsoodloo, S. ; Brown, Daniel B. ; Lin, Chien-Jong
Author_Institution :
IE Dept., Auburn Univ., AL, USA
Volume :
41
Issue :
4
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
547
Lastpage :
553
Abstract :
A cost and reliability model which uses an automatic prototype generator (APG) is presented. According to this model, testers can introduce rapidly prototyped automatically generated codes into the testing phase. The model is called the APG test paradigm (APGTP). Two cases are considered: without a budget constraint, and with both a budget constraint and an objective to maximize the outgoing product reliability. Increased reliability can be attained by applying a five-step procedure. It is shown that the capital requirement for an APG exceeds the available installation cost, then installation of the APG should not be considered unless its reliability per dollar invested exceeds that of the traditional model. To demonstrate the procedures, the costs and reliabilities of the two approaches are compared for certain specified parameter values. The use of APGTP generally produces code of better reliability for the same cost as in traditional testing proposed by D.B. Brown and S. Maghsoodloo (1989)
Keywords :
program testing; software reliability; automatic prototype generator test paradigm; budget constraint; cost analysis; reliability model; software reliability; Automatic testing; Costs; Fault detection; Prototypes; Reliability engineering; Sensitivity analysis; Software prototyping; Software reliability; Software testing; Virtual prototyping;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.249582
Filename :
249582
Link To Document :
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