DocumentCode :
986107
Title :
Selecting the most reliable design under type-II censored accelerated testing
Author :
Chang, Dong-Shang ; Huang, Deng-Yuan ; Tseng, Sheng-Tsaing
Author_Institution :
Dept. of Bus. Adm., Nat. Central Univ., Chung-Li, Taiwan
Volume :
41
Issue :
4
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
588
Lastpage :
592
Abstract :
Accelerated life tests (ALTs) of products and materials are used to obtain reliability information within a reasonable time frame. However, there are no suitable selection rules for selecting the best product or material as a result of the ALT. Under the type-II censoring plan, a reasonable selection rule for an ALT using the Arrhenius model is proposed. The advantages of this selection rule are compared with a nonALT selection rule by using as criteria the average ratio of time-saving in life testing and sample size. The tradeoff between an increased sample size and a shortened life testing time for the ALT selection procedure is feasible
Keywords :
failure analysis; life testing; reliability; Arrhenius model; accelerated testing; design; failure analysis; life tests; reliability; sample size; type-II censoring plan; Life estimation; Life testing; Materials reliability; Materials testing; Maximum likelihood estimation; Reliability engineering; Reliability theory; Statistical analysis; Stress; Temperature;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.249592
Filename :
249592
Link To Document :
بازگشت