Title :
Microstructure and magnetic properties of Ti/CoCrPt/Ti pseudo-sandwich nanogranular films
Author :
Sun, H.Y. ; Hu, J. ; Su, Z.F. ; Xu, J.L. ; Feng, S.Z.
Author_Institution :
Coll. of Phys. Sci. & Inf. Eng., Hebei Normal Univ., Shijiazhuang, China
fDate :
7/1/2006 12:00:00 AM
Abstract :
We prepared Ti/CoCrPt/Ti pseudo-sandwich granular films by radio-frequency and dc magnetron sputtering onto glass substrates and subsequent in situ annealing. We investigated the microstructure and magnetic properties of the films as a function of Ti overlayer thickness (x). X-ray diffraction profiles show that the CoCrPt magnetic layers are formed as the hexagonal close-packed (HCP) structure. Vibrating sample magnetometer measurements indicate that the out-of-plane coercivity reaches the maximum 1675.5 Oe when x=5 nm. Atomic force microscopy images show the minimum average grain size D=7.2 nm and the average roughness Ra=1.0 nm. Magnetic force microscopy images show that the minimum average magnetic cluster size is about 6.4 nm at x=5 nm.
Keywords :
X-ray diffraction; annealing; chromium alloys; cobalt alloys; coercive force; discontinuous metallic thin films; materials preparation; perpendicular magnetic recording; platinum alloys; sputter etching; titanium alloys; HCP structure; Ti-CoCrPt-Ti; X-ray diffraction profiles; atomic force microscopy images; dc magnetron sputtering; glass substrates; hexagonal close-packed structure; magnetic force microscopy images; magnetic granular films; magnetic properties; magnetometer measurements; microstructure properties; out-of-plane coercivity; perpendicular recording media; pseudosandwich nanogranular films; radiofrequency sputtering; Annealing; Atomic force microscopy; Glass; Magnetic films; Magnetic properties; Microstructure; Radio frequency; Sputtering; X-ray diffraction; X-ray imaging; Coercivity; magnetic granular films; overlayer; perpendicular recording media;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.874095
