• DocumentCode
    986351
  • Title

    On the ZBDD-based nonenumerative path delay fault coverage calculation

  • Author

    Kocan, Fatih ; Gunes, Mehmet H.

  • Author_Institution
    Comput. Sci. & Eng. Dept., Southern Methodist Univ., Dallas, TX, USA
  • Volume
    24
  • Issue
    7
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    1137
  • Lastpage
    1143
  • Abstract
    We devise one exact and one pessimistic path delay fault (PDF) grading algorithms for combinational circuits. The first algorithm, an extension to the basic grading algorithm of Padmanaban, Michael, and Tragoudas (2003), does not store all of the detected PDFs during the course of grading, and, as a further improvement, it utilizes compressed representation of PDFs. These two techniques yield a space-and-time efficient algorithm. To enable grading of circuits with exponential number of paths, a circuit is first partitioned into a set of subcircuits. The second algorithm efficiently calculates the coverage of partitioned circuits. The former algorithm results in 50%-70% reduction in space and a speedup from 1.6 to 2.48 in ISCAS85 benchmarks. The time complexity of the latter algorithm is O(N2) subset operations per test vector where N is the number of nets in the circuit.
  • Keywords
    circuit analysis computing; circuit complexity; combinational circuits; fault diagnosis; logic partitioning; logic testing; ZBDD; circuit testing; combinational circuits; logic partitioning; logic testing; nonenumerative path delay fault coverage calculation; path delay fault grading algorithms; time complexity; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Data structures; Delay effects; Partitioning algorithms; Sequential analysis; Timing; Very large scale integration; Fault grading; path delay fault (PDF); simulation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.850851
  • Filename
    1458939