DocumentCode
986527
Title
Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis
Author
Dilhaire, S. ; Grauby, S. ; Claeys, W.
Author_Institution
CPMOH-Univ. Bordeaux, Talence, France
Volume
26
Issue
7
fYear
2005
fDate
7/1/2005 12:00:00 AM
Firstpage
461
Lastpage
463
Abstract
In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.
Keywords
calibration; semiconductor lasers; temperature measurement; thermoreflectance; Peltier element; catastrophic optical facet damage analysis; laser diode; semiconductor lasers; temperature measurement; temperature sensor; thermoreflectance calibration; Calibration; Diode lasers; Electric variables measurement; Optical control; Optical design; Optical sensors; Temperature control; Temperature sensors; Testing; Thermoreflectance; Reliability; semiconductor lasers; temperature measurement; thermoreflectance;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2005.851090
Filename
1458956
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