• DocumentCode
    986527
  • Title

    Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis

  • Author

    Dilhaire, S. ; Grauby, S. ; Claeys, W.

  • Author_Institution
    CPMOH-Univ. Bordeaux, Talence, France
  • Volume
    26
  • Issue
    7
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    461
  • Lastpage
    463
  • Abstract
    In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.
  • Keywords
    calibration; semiconductor lasers; temperature measurement; thermoreflectance; Peltier element; catastrophic optical facet damage analysis; laser diode; semiconductor lasers; temperature measurement; temperature sensor; thermoreflectance calibration; Calibration; Diode lasers; Electric variables measurement; Optical control; Optical design; Optical sensors; Temperature control; Temperature sensors; Testing; Thermoreflectance; Reliability; semiconductor lasers; temperature measurement; thermoreflectance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2005.851090
  • Filename
    1458956