• DocumentCode
    986789
  • Title

    Real-time multi-DSP based VME system for feedback control on the TCV Tokamak

  • Author

    Rodrigues, A.P. ; Pereira, L. ; Madeira, T.I. ; Amorim, P. ; Varandas, C.A.F. ; Duval, B.

  • Author_Institution
    Associacao EURATOM/IST, Lisboa, Portugal
  • Volume
    53
  • Issue
    3
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    845
  • Lastpage
    848
  • Abstract
    This paper describes a real-time pulse height analysis diagnostic for feedback control of the TCV plasma. The implementation of this diagnostic is based on a new generation X-ray detector with high resolution and count rate, an in-house developed VME intelligent module, with parallel processing capabilities provided by four Digital Signal Processors, and several digital signal processing algorithms. Results show that a value of the electron temperature (Te) can be calculated in approximately 100 ms, thus providing a twenty-value Te profile during a TCV discharge. The time resolution might be increased by improving the X-ray detecting system and/or the processing procedures.
  • Keywords
    Tokamak devices; X-ray detection; digital signal processing chips; parallel processing; plasma diagnostics; pulse analysers; real-time systems; system buses; TCV Tokamak; TCV plasma; VME intelligent module; X-ray detector; count rate; electron temperature; nuclear fusion; real time data acquisition control; real time digital signal processing; real time feedback control; real time parallel processing; real-time multiDSP; real-time pulse height analysis; time resolution; Feedback control; Plasma diagnostics; Plasma materials processing; Plasma temperature; Plasma x-ray sources; Real time systems; Signal generators; Signal resolution; Tokamaks; X-ray detectors; Real time data acquisition control; nuclear fusion; real time digital signal processing; real time feedback control; real time parallel processing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2006.874498
  • Filename
    1644951