Title :
A Robust Method to Accurately Treat Arbitrarily Curved 3-D Thin Conductive Sheets in FDTD
Author :
Schild, Stefan ; Chavannes, Nicolas ; Kuster, Niels
Author_Institution :
Found. for Res. on Inf. Technol. in Soc. (IT´´IS), Zurich
Abstract :
In this paper, we propose a novel method to treat thin conductive (TC) sheets of arbitrary three-dimensional (3-D) shape and curvature with the electromagnetic (EM) finite-difference time-domain (FDTD) algorithm without the need to resolve the sheet thickness spatially. We show that the physical properties of TC sheets enable us to do so without introducing additional field components to the conventional Yee scheme. Due to this noninvasive approach, in addition to the preserved stability of the FDTD algorithm, the method can be directly applied to any existing FDTD kernel, such as parallelized or hardware accelerated versions. The method has been developed within the framework of a professional EM FDTD software package and tested on real-world problems.
Keywords :
coatings; finite difference time-domain analysis; thin films; FDTD kernel; arbitrarily curved 3D shape; electromagnetic finite difference time domain algorithm; noninvasive approach; physical properties; robust method; thin conductive sheets; Acceleration; Finite difference methods; Hardware; Kernel; Robustness; Shape; Software packages; Spatial resolution; Stability; Time domain analysis; Coatings; electromagnetic (EM) compatibility; finite-difference time-domain (FDTD) methods; metals; modeling; numerical analysis; simulation; software; thin films;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2007.910321