• DocumentCode
    987021
  • Title

    Measurements of 1/f frequency noise reduction in semiconductor lasers using optical feedback with dispersive loss

  • Author

    Kitching, J. ; Shevy, Y. ; Iannelli, J. ; Yariv, A.

  • Author_Institution
    California Inst. of Technol., Pasadena, CA, USA
  • Volume
    11
  • Issue
    10
  • fYear
    1993
  • fDate
    10/1/1993 12:00:00 AM
  • Firstpage
    1526
  • Lastpage
    1532
  • Abstract
    The authors review the theoretical framework for linewidth reduction in semiconductor lasers using optical feedback with dispersive loss. These results are then applied to lasers having both white and 1/f frequency noise. Experimental confirmation of the dependence of frequency noise on feedback parameters is presented using optical feedback from an external cavity containing Cs vapor. It is shown that such feedback reduces the frequency noise spectrum uniformly within its operating bandwidth. It is also shown that where white noise is dominant, the linewidth is reduced by the same factor, 1/Q2, as the frequency noise spectrum, but, when 1/f noise dominates, the linewidth is reduced only by 1/Q
  • Keywords
    feedback; optical loss measurement; random noise; semiconductor device noise; semiconductor lasers; spectral line breadth; white noise; 1/f frequency noise reduction; Cs; Cs vapor; dispersive loss; external cavity; feedback parameters; frequency noise; frequency noise spectrum; linewidth reduction; operating bandwidth; optical feedback; review; semiconductor lasers; white noise; Frequency measurement; Laser feedback; Laser noise; Laser theory; Noise measurement; Noise reduction; Optical feedback; Optical noise; Semiconductor device noise; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.249891
  • Filename
    249891