DocumentCode
987225
Title
a-Si:H MIS position sensitive detector by anodic oxidation processes
Author
Arimoto, S. ; Yamamoto, Hiroshi ; Ohno, Hideo ; Hasegawa, Hiroshi
Author_Institution
Hokkaido University, Department of Electrical Engineering, Faculty of Engineering, Sapporo, Japan
Volume
19
Issue
16
fYear
1983
Firstpage
628
Lastpage
629
Abstract
The first fabrication of an amorphous silicon position-sensitive detector using an MIS structure by anodic oxidation processes is reported. The fabricated 3 mm à 26 mm one-dimensional position-sensitive detectors show excellent linearity with lateral photocurrent response, having a correlation coefficient of 0.996.
Keywords
amorphous semiconductors; elemental semiconductors; hydrogen; metal-insulator-semiconductor devices; photodetectors; semiconductor thin films; silicon; MIS position sensitive detector; amorphous Si:H films; anodic oxidation processes; lateral photocurrent response; one dimensional structure;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19830428
Filename
4247926
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