• DocumentCode
    987277
  • Title

    Optical coherence domain reflectometry by synthesis of coherence function

  • Author

    Hotate, Kazuo ; Kamatani, Osamu

  • Author_Institution
    Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
  • Volume
    11
  • Issue
    10
  • fYear
    1993
  • fDate
    10/1/1993 12:00:00 AM
  • Firstpage
    1701
  • Lastpage
    1710
  • Abstract
    Reflectometry by synthesis of optical coherence function using a laser diode as a light source for high resolution measurements of optical systems and waveguide devices is proposed. This method has no mechanical moving parts. The oscillation frequency of the laser diode is controlled by the injection current with an appropriate waveform and the coherence function, which corresponds to the time-averaged spectrum shape, is synthesized. The principle that includes three types of synthesized coherence function is presented. The basic experiments of the three methods have been successfully carried out and the resolution about 10 mm in air is demonstrated using an ordinary Fabry-Perot-type single-mode laser diode. The performance deterioration factors of the most promising method are also discussed, in which a coherence function with a delta-function-like shape along the optical path is synthesized to obtain the reflectivity distribution directly
  • Keywords
    light interferometry; light sources; optical systems; reflectivity; reflectometry; semiconductor lasers; Fabry-Perot-type single-mode laser diode; air; coherence function; delta-function-like shape; high resolution measurements; injection current; laser diode; light source; optical coherence domain reflectometry; optical coherence function; optical path; optical systems; oscillation frequency; performance deterioration factors; reflectivity distribution; synthesized coherence function; time-averaged spectrum shape; waveguide devices; Coherence; Control system synthesis; Diode lasers; Frequency synthesizers; Light sources; Optical control; Optical devices; Optical waveguides; Reflectometry; Shape control;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.249913
  • Filename
    249913