• DocumentCode
    987297
  • Title

    High-Sensitivity Metal–Semiconductor–Metal Hydrogen Sensors With a Mixture of Pd and \\hbox {SiO}_{2} Forming Three-Dimensional Dipoles

  • Author

    Chiu, Shao-Yen ; Huang, Hsuan-Wei ; Huang, Tze-Hsuan ; Liang, Kun-Chieh ; Liu, Kang-Ping ; Tsai, Jung-Hui ; Lour, Wen-Shiung

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Ocean Univ., Keelung
  • Volume
    29
  • Issue
    12
  • fYear
    2008
  • Firstpage
    1328
  • Lastpage
    1331
  • Abstract
    New metal-semiconductor-metal hydrogen sensors are fabricated to take advantages of symmetrically bidirectional detection. Unlike commonly used single catalytic metal layers, a mixture of Pd and SiO2 inserted between Pd and GaN was employed as sensing media. There are three sensing regions (i.e., 2-D dipole, transient, and 3-D dipole regions) observed in static response. Room-temperature sensitivity larger than 107 was obtained in 1080-ppm H2/N2 ambient. The barrier-height variation is as high as 422 mV. To our best knowledge, these are the highest values ever reported. According to transient response, a short response time of 70 s is obtained at room temperature. Thus, a newly developed concept of forming 3-D dipoles is introduced to possibly explain experimental results.
  • Keywords
    III-V semiconductors; chemical variables measurement; gallium compounds; gas sensors; hydrogen; metal-semiconductor-metal structures; palladium; silicon compounds; transient response; wide band gap semiconductors; 2D dipole; 3D dipole regions; H2; Pd-SiO2-GaN; barrier-height variation; catalytic metal layers; metal-semiconductor-metal hydrogen sensors; symmetrically bidirectional detection; temperature 293 K to 298 K; time 70 s; transient response; Chemical sensors; Delay; Gallium nitride; Hydrogen; Image sensors; Ocean temperature; Schottky barriers; Schottky diodes; Semiconductor diodes; Temperature sensors; Hydrogen sensor; Pd; metal–semiconductor–metal (MSM); sensitivity;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.2006994
  • Filename
    4671159