Title :
Comparison of smoothness evaluation devices for power cable compounds
Author :
Flenniken, C.L. ; Keefe, R.J.
Author_Institution :
BICC Cables Corp., Indianapolis, IN, USA
Abstract :
A variety of data from different devices has been generated on the smoothness of shield products, but no direct comparison of compound smoothness for the devices themselves has been made. The purpose of this study was to compare four different methods for evaluating the smoothness of power cable compounds. The methods compared include: image analysis, laser scanning, mechanical profilometry and photomicroscopy with visual rating. Extruded tape samples of conductor shields, filled insulations and strippable shields were evaluated.<>
Keywords :
cable insulation; cable sheathing; measurement by laser beam; optical microscopy; power cables; surface topography measurement; conductor shields; extruded tape samples; filled insulations; image analysis; laser scanning; mechanical profilometry; photomicroscopy; power cable compounds; shield products; smoothness evaluation devices; strippable shields; Cable insulation; Computer interfaces; Conducting materials; Dielectric materials; Image analysis; Inspection; Laser noise; Power cables; Semiconductor device noise; Semiconductor materials;
Journal_Title :
Electrical Insulation Magazine, IEEE
