Title :
Capacity-achieving ensembles for the binary erasure channel with bounded complexity
Author :
Pfister, Henry D. ; Sason, Igal ; Urbanke, Rüdiger
Author_Institution :
Qualcomm Inc., San Diego, CA, USA
fDate :
7/1/2005 12:00:00 AM
Abstract :
We present two sequences of ensembles of nonsystematic irregular repeat-accumulate (IRA) codes which asymptotically (as their block length tends to infinity) achieve capacity on the binary erasure channel (BEC) with bounded complexity per information bit. This is in contrast to all previous constructions of capacity-achieving sequences of ensembles whose complexity grows at least like the log of the inverse of the gap (in rate) to capacity. The new bounded complexity result is achieved by puncturing bits, and allowing in this way a sufficient number of state nodes in the Tanner graph representing the codes. We derive an information-theoretic lower bound on the decoding complexity of randomly punctured codes on graphs. The bound holds for every memoryless binary-input output-symmetric (MBIOS) channel and is refined for the binary erasure channel.
Keywords :
channel capacity; channel coding; graph theory; iterative decoding; memoryless systems; message passing; parity check codes; BEC; IRA; LDPC; MBIOS; Tanner graph; binary erasure channel; decoding; iterative decoding; low-density parity-check codes; memoryless binary-input output-symmetric channel; message-passing; nonsystematic irregular repeat-accumulate codes; Channel capacity; Code standards; Communication channels; Communication standards; Error correction codes; H infinity control; Information theory; Iterative algorithms; Iterative decoding; Parity check codes; Binary erasure channel (BEC); Tanner graph; codes on graphs; degree distribution (d.d.); density evolution (DE); irregular repeat–accumulate (IRA) codes; low-density parity-check (LDPC) codes; memoryless binary-input output-symmetric (MBIOS) channel; message-passing iterative (MPI) decoding; punctured bits; state nodes;
Journal_Title :
Information Theory, IEEE Transactions on
DOI :
10.1109/TIT.2005.850079