Title :
Optical losses in metal/SiO2-clad Ti:LiNbO3 waveguides
Author :
Buhl, Lawrence L.
Author_Institution :
Bell Laboratories, Holmdel, USA
Abstract :
We present measured excess loss resulting from electrode overlays for both TE and TM polarisations as a function of SiO2 buffer layer thickness for Ti:LiNbO3 strip waveguides at ¿ = 1.32 ¿m. We find there is negligible excess loss to the TE mode with no buffer layer and that the excess loss to the TM mode can be essentially eliminated with a SiO2 layer only 700 Ã
thick. A passive polariser with ¿ 1.5 dB fibre-waveguide-fibre insertion loss and > 13 dB extinction ratio is also demonstrated.
Keywords :
integrated optics; lithium compounds; loss measurement; losses; optical waveguides; titanium; 1.32 microns; SIO2 buffer layer thickness; TE polarisations; TM polarisations; Ti:LiNbO3 strip waveguides; electrode overlays; excess loss; extinction ratio; insertion loss; optical losses; passive polariser;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830449