Title :
True swap gate design for on chip cache organization megabit bubble memory
Author :
Kohara, H. ; Takahashi, K. ; Suga, S. ; Fujiwara, S.
Author_Institution :
Nippon Electric Company, Ltd., Kawasaki, Japan
fDate :
11/1/1981 12:00:00 AM
Abstract :
A highly reliable true swap gate for on chip cache organization megabit chip has been developed, which was designed to swap bubble strings between cache and storage by controlling current in a single conductor pattern. This gate consists of two pairs of transfer gate and merge to match 7 μm period folded minor loop. The gate conductor was improved so as not to block the bubble propagation by the swap out current during the continuous operation. The results in actual 1 Mb chips showed a wide margin of 22 Oe, reliable operation with a 15 mA gate current, 55 Oe to 65 Oe sinusoidal rotating field drive at 125 kHz, 0° to 75° C temperature and less margin loss of 2.0 Oe on the constant order swap mode operation, which eased bubble controller for on chip cache organization.
Keywords :
Magnetic bubble memories; Cache storage; Circuits; Conductors; Costs; Detectors; Equations; Frequency; Temperature control;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1981.1061760