• DocumentCode
    987828
  • Title

    A Novel Feature Selection Methodology for Automated Inspection Systems

  • Author

    Garcia, Hugo C. ; Villalobos, Jesus Rene ; Pan, Rong ; Runger, George C.

  • Author_Institution
    Electro-Opt. Syst., L3, Tempe, AZ
  • Volume
    31
  • Issue
    7
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    1338
  • Lastpage
    1344
  • Abstract
    This paper proposes a new feature selection methodology. The methodology is based on the stepwise variable selection procedure, but, instead of using the traditional discriminant metrics such as Wilks´ Lambda, it uses an estimation of the misclassification error as the figure of merit to evaluate the introduction of new features. The expected misclassification error rate (MER) is obtained by using the densities of a constructed function of random variables, which is the stochastic representation of the conditional distribution of the quadratic discriminant function estimate. The application of the proposed methodology results in significant savings of computational time in the estimation of classification error over the traditional simulation and cross-validation methods. One of the main advantages of the proposed method is that it provides a direct estimation of the expected misclassification error at the time of feature selection, which provides an immediate assessment of the benefits of introducing an additional feature into an inspection/classification algorithm.
  • Keywords
    automatic optical inspection; feature extraction; pattern classification; automated inspection systems; discriminant metrics; feature selection; misclassification error rate; quadratic discriminant function estimate; stepwise variable selection procedure; Feature selection; Implementation; Industrial automation; misclassification error rate; quadratic discriminant function.; Algorithms; Artificial Intelligence; Computer Simulation; Equipment Failure Analysis; Models, Theoretical; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2008.276
  • Filename
    4674369