A review on RF ESD protection design

Author

Wang, ZhiHua ; Feng, Haigang ; Zhan, Rouying ; Xie, Haolu ; Chen, Guang ; Wu, Qiong ; Guan, Xiaokang ; Zhihua Wang ; Zhang, Chun

Author_Institution

Dept. of Electron. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA

Volume

52

Issue

7

fYear

2005

fDate

7/1/2005 12:00:00 AM

Firstpage

1304

Lastpage

1311

Abstract

Radio frequency (RF) electrostatic discharge (ESD) protection design emerges as a new challenge to RF integrated circuits (IC) design, where the main problem is associated with the complex interactions between the ESD protection network and the core RFIC circuit being protected. This paper reviews recent development in RF ESD protection circuit design, including mis-triggering of RF ESD protection structures, ESD-induced parasitic effects on RFIC performance, RF ESD protection solutions, as well as characterization of RF ESD protection circuits.

Keywords

electrostatic discharge; integrated circuit design; protection; radiofrequency integrated circuits; ESD-induced parasitic effect; RF ESD protection circuits; RF ESD protection structures; RF integrated circuit design; electrostatic discharge protection design; radio frequency electrostatic discharge; Circuit synthesis; Electrostatic discharge; Handheld computers; Integrated circuit noise; Protection; Radio frequency; Radiofrequency identification; Radiofrequency integrated circuits; Research and development; Semiconductor device noise; Electrostatic discharge (ESD); electrostatic discharge (ESD) protection; parasitic; radio frequency (RF) electrostatic discharge (ESD);

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2005.850652

Filename

1459087