• DocumentCode
    987878
  • Title

    Application of indium-tin-oxide with improved transmittance at 1.3 mu m for MSM photodetectors

  • Author

    Seo, Jong-Wook ; Caneau, Catherine ; Bhat, Rajaram ; Adesida, Ilesanmi

  • Author_Institution
    Center for Compound Semicond. Microelectron., Illinois Univ., Urbana, IL, USA
  • Volume
    5
  • Issue
    11
  • fYear
    1993
  • Firstpage
    1313
  • Lastpage
    1315
  • Abstract
    The optical transmittance of indium-tin oxide (ITO) at a wavelength of 1.3 mu m has been improved by adding forming gas (H/sub 2//N/sub 2/) to the Ar sputtering gas. It is shown that the presence of H/sub 2/ in the plasma decreases the carrier concentration in ITO and increases the optical transmittance of a 320 nm-thick ITO film from 69.7% to 99.5%. The application of the high transmittance ITO to the fabrication of metal-semiconductor-metal (MSM) photodiodes on InAlAs/InGaAs heterostructures has resulted in an improvement of responsivity from 0.6 A/W to 0.76 A/W. This is double the responsivity of 0.39 A/W obtained for Ti/Au detectors. A 3-dB bandwidth of 6 GHz was obtained for the high transparency ITO device with 3 mu m fingers and gaps and with an area of 50 mu m*50 mu m.<>
  • Keywords
    carrier density; infrared detectors; light transmission; metal-semiconductor-metal structures; optical films; photodetectors; photodiodes; semiconductor thin films; sputtered coatings; transparency; 1.3 micron; 3 micron; 3-dB bandwidth; 320 nm; 50 micron; 6 GHz; Ar sputtering gas; Ar-H/sub 2/-N/sub 2/; H/sub 2//N/sub 2/; ITO; InAlAs-InGaAs; InSnO; MSM photodetectors; MSM photodiodes; carrier concentration; fabrication; forming gas; high transmittance; high transparency ITO device; improved transmittance; optical transmittance; plasma; responsivity; Argon; Indium compounds; Indium gallium arsenide; Indium tin oxide; Optical device fabrication; Optical films; Photodiodes; Plasma applications; Plasma waves; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.250054
  • Filename
    250054