DocumentCode :
987985
Title :
Noncoherent spectral analysis of ADC using filter Bank
Author :
Rebai, Chiheb ; Dallet, Dominique ; Marchegay, Philippe
Author_Institution :
Lab. IXL-ENSEIRB, Univ. of Bordeaux, Talence, France
Volume :
53
Issue :
3
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
652
Lastpage :
660
Abstract :
The aim of this paper is to propose a new spectral analysis method for an on-chip analog-to-digital converter (ADC) dynamic test. ADC characterization by spectral analysis has traditionally been done with discrete Fourier transform. This method imposes restrictions to optimize results; one of these is coherent sampling. Recently, some filter structures have been used for spectral analysis of a sinusoidal signal corrupted by harmonics and noise. In this paper, we present a new filter bank structure used for decomposing a signal into its main spectral components. The main application examined is ADC spectral parameter estimation, like signal-to-noise and distortion ratio, signal to noise ratio, total harmonic distortion, and so on, in noncoherent sampling. Computer simulations are used to demonstrate the performance of the proposed filter bank scheme. This structure is a promising built-in self-test (BIST) approach for ADC ICs.
Keywords :
analogue-digital conversion; built-in self test; notch filters; parameter estimation; sampling methods; spectral analysis; analog-to-digital converter; built-in self-test; coherent sampling; computer simulations; discrete Fourier transform; distortion ratio; dynamic test; filter bank structure; noncoherent sampling; noncoherent spectral analysis; notch filter; on-chip ADC; signal-to-noise; sinusoidal signal; spectral components; spectral parameter estimation; total harmonic distortion; Analog-digital conversion; Built-in self-test; Discrete Fourier transforms; Filter bank; Optimization methods; Power harmonic filters; Sampling methods; Spectral analysis; Testing; Total harmonic distortion; ADC; Analog-to-digital converter; filter bank; notch filter; spectral analysis; testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2004.827077
Filename :
1299124
Link To Document :
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