Title :
Direct observation of visibility curve of semiconductor lasers
Author :
Eickhoff, W. ; Brinkmeyer, Ernst ; Barfu¿?, H.
Author_Institution :
Technische Universitÿt Hamburg-Harburg, Hamburg, West Germany
Abstract :
A method for the determination of the linewidth of semiconductor lasers is demonstrated. It employs tuning of the laser frequency, observation of the backscattered light from a single-mode fibre and Fourier-transform evaluation.
Keywords :
laser beams; light interferometry; optical variables measurement; semiconductor junction lasers; Fourier-transform evaluation; backscattered light observation; laser frequency tuning; light interferometry; linewidth; optical variables measurement; semiconductor lasers; single-mode fibre; visibility curve;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830503
