DocumentCode :
988082
Title :
A robust high-Q micromachined RF inductor for RFIC applications
Author :
Lin, Jr-Wei ; Chen, C.C. ; Cheng, Yu-Ting
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Volume :
52
Issue :
7
fYear :
2005
fDate :
7/1/2005 12:00:00 AM
Firstpage :
1489
Lastpage :
1496
Abstract :
In this paper, a robust micromachined spiral inductor with a cross-shaped sandwich membrane support is proposed and fabricated with fully CMOS compatible post-processes for radio frequency integrated circuit (RFIC) applications. Using the incorporation of a sandwich dielectric membrane (0.7 μm SiO2/0.7 μm Si3N4/0.7 μm TEOS) to enhance the structure rigidity, the inductor can have better signal stability. In comparison, the new design of a ∼5-nH micromachined inductor can have 45% less inductance variation than the one without the dielectric support while both devices are operated with 10 m/s2 acceleration. Meanwhile, using a cross shape instead of blanket membrane can also effectively eliminate the inductance variation induced by the working temperature change (20°C to 75°C). The measurement results show the robust inductor can have similar electrical performance to the as-fabricated freely suspended inductor, which has five times Q (quality factor) improvement than the inductor without the substrate removal. It is our belief that the new micromachined inductors can have not only high-Q performance but also better signal stability suitable for wide-range RFIC applications.
Keywords :
CMOS integrated circuits; Q-factor; inductors; integrated circuit design; micromachining; radiofrequency integrated circuits; CMOS IC; high-Q micromachined RF inductor; micromachined spiral inductor; quality factor; radio frequency integrated circuit; sandwich dielectric membrane; signal stability; structure rigidity; Acceleration; Biomembranes; Circuit stability; Dielectric devices; Inductance; Inductors; Radio frequency; Radiofrequency integrated circuits; Robustness; Spirals; Accelerative and thermal disturbance system; high-Q micromachined inductor; radio frequency integrated circuit (RFIC); robust design; signal stability;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.850612
Filename :
1459109
Link To Document :
بازگشت