DocumentCode :
988122
Title :
High-Frequency-Measurement-Based Circuit Modeling and Power/Ground Integrity Evaluation of Integrated Circuit Packages
Author :
Kim, Heungkyu ; Eo, Yungseon
Author_Institution :
Dept. of Electr. & Comput. Eng., Hanyang Univ., Ansan
Volume :
31
Issue :
4
fYear :
2008
Firstpage :
910
Lastpage :
918
Abstract :
The frequency-variant characteristics of a pair of package power and ground net are experimentally investigated and modeled by using frequency-variant grid-type equivalent circuits, where each cell of the grid is modeled with vertically stacked RLC-ladder circuits. Various test patterns are designed and fabricated by employing a ball grid array (BGA) package process. Then the test patterns are characterized by using impedance analyzer, time domain reflectometry and time domain transmission (TDR/TDT), and vector network analyzer (VNA). Based on the experimental characterizations, not only are material constants and circuit model parameters determined, but also the conductor roughness and other frequency-variant effects are modeled. It is shown that the SPICE-based circuit simulation using the proposed circuit model has an excellent agreement with the measurement data in the range of 100 MHz - 15 GHz. Then, it is also shown that the various types of package performance evaluations can be very efficiently as well as accurately achieved with the proposed technique.
Keywords :
ball grid arrays; equivalent circuits; integrated circuit packaging; time-domain reflectometry; SPICE-based circuit simulation; ball grid array package process; frequency 100 MHz to 15 GHz; frequency-variant grid-type equivalent circuits; high-frequency-measurement-based circuit modeling; integrated circuit packages; power-ground integrity evaluation; time domain reflectometry; time domain transmission; vector network analyzer; vertically stacked RLC-ladder circuits; Circuit testing; Conducting materials; Electronics packaging; Equivalent circuits; Frequency; Impedance; Integrated circuit modeling; Integrated circuit packaging; Pattern analysis; Time domain analysis; S-parameters; Ball grid array (BGA) package; frequency variant circuit model; power distribution net; skin effect; transmission line;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2008.2005472
Filename :
4674542
Link To Document :
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