• DocumentCode
    988192
  • Title

    Substrate voltage and accumulation-mode MOS varactor capacitance

  • Author

    Wartenberg, Scott A. ; Hauser, John R.

  • Author_Institution
    Booz Allen Hamilton, Arlington, VA, USA
  • Volume
    52
  • Issue
    7
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    1563
  • Lastpage
    1567
  • Abstract
    To adjust the capacitance of an accumulation-mode MOS varactor, a voltage is applied to the drain/source with the gate grounded. In this novel arrangement, a voltage is applied to the gate Vgate and another to the substrate Vsub with the drain/source grounded. Applying Vsub between the p+-type substrate and the varactor´s n-well adjusts the minimum capacitance Cmin and flattens the overall capacitance-voltage (C-V) curve over a wide range of negative Vgate. Measurements show the tuning range using Vsub to be as wide as that using Vgate. By tuning with Vsub, the capacitance Cmin is constant over a range of negative Vgate. In this region, it may be possible to apply a large ac signal on Vgate without modulating the capacitance. To illustrate this technique, C-V measurements of a MOS varactor are simulated in a differential LC-tank VCO circuit. Simulations show how adjusting both Vgate and Vsub alters the oscillation frequency.
  • Keywords
    MIS devices; MOS capacitors; capacitance; capacitance measurement; circuit simulation; varactors; voltage measurement; voltage-controlled oscillators; C-V measurements; LC-tank VCO circuit; MOS varactor capacitance; accumulation-mode; capacitance-voltage curve; metal-oxide-semiconductor; minimum capacitance; oscillation frequency; phase noise; substrate voltage; tuning range; voltage-controlled oscillator; Capacitance measurement; Circuit simulation; Electrical resistance measurement; Frequency; Phase noise; Substrates; Tuning; Varactors; Voltage; Voltage-controlled oscillators; Accumulation mode; capacitance; metal–oxide–semiconductor (MOS); phase noise; varactor; voltage-controlled oscillator (VCO);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.850953
  • Filename
    1459120