Title :
Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements
Author :
Pintelon, Rik ; Rolain, Yves ; Vandersteen, Gerd ; Schoukens, Johan
Author_Institution :
Electr. Meas. Dept., Vrije Univ. Brussel, Brussels, Belgium
fDate :
6/1/2004 12:00:00 AM
Abstract :
Using specially designed broadband periodic random excitation signals, the open loop gain, and the common mode and power supply rejection ratios of operational amplifiers are measured and modeled. The proposed modeling technique 1) takes into account the measurement uncertainty and the nonlinear distortions, 2) gives information about possible unmodeled dynamics, 3) detects, quantifies, and classifies the nonlinear distortions, and 4) provides opamp parameters (time constants, gain-bandwidth product, etc.) with confidence bounds. The approach is suitable for the experimental characterization of operational amplifiers (see Part II) as well as the fast evaluation of new operational amplifiers designs using network simulators (see [12]). Part II handles the calibration of the experimental setup and illustrates the theory on real measurements.
Keywords :
calibration; circuit simulation; measurement uncertainty; nonlinear distortion; operational amplifiers; broadband signals; common mode rejection ratio; measurement uncertainty; network simulators; nonlinear distortions; opamp parameters; open loop gain; operational amplifiers; periodic signals; power supply rejection ratio; random excitation signals; system identification; unmodeled dynamics; Broadband amplifiers; Calibration; Distortion measurement; Nonlinear distortion; Operational amplifiers; Power amplifiers; Power supplies; Power system modeling; Signal design; System identification; Common mode rejection; linear characteristics; nonlinear distortions; open loop gain; operational amplifier; power supply rejection; system identification;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2004.827092