Timing Randomly Spaced Events Using the Threshold-Voltage Shift in Disordered Semiconductors

This paper discusses the concept of using the threshold-voltage shift in disordered-semiconductor-based thin- film transistors to measure the time of occurrence of randomly spaced events of interest. We call the experimental circuit an "analog clock." The analog clock is shown to be accurate while, at the same time, being simple in design using just one transistor.