Title :
A new method of noise parameter calculation using direct matrix analysis
Author :
Mokari, M. Ebrahim ; Patience, William
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio Univ., Athens, OH, USA
fDate :
9/1/1992 12:00:00 AM
Abstract :
A generalized matrix approach to noise analysis of multiport networks with arbitrary topology is presented. The network may be composed of any number of passive components and active two-port devices. The method is direct and easy to follow and has been implemented in a computer program. The program is based on admittance matrix formulation and noise current sources of each device and their correlations. For MESFET devices, one can supply the noise parameters of each device or its physical and geometrical parameters for evaluation of the noise sources and their correlations
Keywords :
Schottky gate field effect transistors; circuit analysis computing; semiconductor device models; semiconductor device noise; MESFET devices; active two-port devices; admittance matrix formulation; direct matrix analysis; generalized matrix approach; multiport networks; noise analysis; noise current sources; noise parameter calculation; passive components; Acoustic reflection; Admittance; Circuit noise; Equations; FETs; Frequency conversion; MESFETs; Network topology; Noise figure; Voltage;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
