988867

Reply: Analysis of radiative and nonradiative recombination law in lightly doped InGaAsP lasers

Thompson, G.H.B.

STL Ltd, Harlow, UK

19

21

1983

868

integrated circuit testing; masks; monolithic integrated circuits; CAD system; MOS technology; high resolution aligners; mask levels; mask misalignment; mask resolution; semiconductor IC testing; test structure; vernier;

English

Electronics Letters

iet

0013-5194

jour

10.1049/el:19830590

4248118