• DocumentCode
    989100
  • Title

    Planar process for 8-µm period bubble devices using polyimide resin

  • Author

    Umezaki, Hiroshi ; Nishida, Hideki ; Tsumita, Norikazu ; Koyama, Naoki ; Nozawa, Hisao ; Sugita, Yutaka

  • Author_Institution
    Central Research Laboratory, Hitachi, Kokubunji, Tokyo, Japan
  • Volume
    18
  • Issue
    2
  • fYear
    1982
  • fDate
    3/1/1982 12:00:00 AM
  • Firstpage
    753
  • Lastpage
    758
  • Abstract
    A new and simple planar process using polyimide resin, polyimide iso-indroquinazolinedione (PIQ®), has been developed for 8-μm period bubble devices. PIQ is strongly heat resistant. This material is used as an interlaminar dielectric between conductor and Permalloy patterns. The PIQ layer effectively covers the steep steps of Au/Mo conductor patterns, thereby eliminating the problem of Permalloy step coverage at conductor edges. A 256-kbit memory device with an 8-μm period fabricated by the planar process exhibits an overall bias margin of more than 10 percent over the temperature range 15°C to 80°C for 300-kHz operation at a drive field of 55 Oe. PIQ does not introduce constraints on other process parameters or chip designs. Reproducibility and reliability of bubble devices fabricated by the PIQ process have been good.
  • Keywords
    Magnetic bubble device fabrication; Plastic insulation; Conductive films; Conductors; Magnetic films; Magnetic properties; Polyimides; Resins; Semiconductor films; Stability; Substrates; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1982.1061916
  • Filename
    1061916