Title :
Elastic profile measurements of optical fibres via reflection acoustic microscopy
Author :
Jen, C.K. ; Bussi¿¿re, J. ; Farnell, G.W. ; Kinsella, R.D.
Author_Institution :
National Research Council of Canada, Industrial Materials Research Institute, Boucherville, Canada
Abstract :
The concentration of dopant materials which are responsible for the variation of the dielectric profile of the fused SiO2 host material for optical fibres also changes the elastic properties. This change has been observed by an acoustic microscope operated at 450 MHz. Acoustic micrographs of single-mode, multimode graded-index and multimode step-index optical fibres are given. This technique may be applicable to the study of fibre acoustic waveguides.
Keywords :
acoustic microscopes; elasticity; optical fibres; 450 MHz; concentration of dopant materials; dielectric profile; elastic profile measurements; fibre acoustic waveguides; fused SiO2 host material; multimode graded index fibres; multimode step index fibres; optical fibres; reflection acoustic microscopy; single mode fibres;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830630
