Title :
Measurements of the semiconductor laser linewidth broadening factor
Author :
Henning, I.D. ; Collins, J.V.
Author_Institution :
British Telecom Research Laboratories, Ipswich, UK
Abstract :
A new method is presented for determining the semiconductor-laser linewidth-broadening factor ¿. Measurements on 1.5 ¿m devices suggest that ¿ decreases with decreasing laser length. 300 ¿m-long devices emitting at 1.3 and 1.5 ¿m were found to have similar values of ¿ (6.6 cf. 6 4), but at 0.85 ¿m significantly lower results were measured (2.8)
Keywords :
optical variables measurement; semiconductor junction lasers; spectral line breadth; 1.3 micron devices; 1.5 micron devices; semiconductor laser linewidth broadening factor; spectral linewidth;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19830633
