DocumentCode :
989981
Title :
Fabrication and wafer testing of barber-pole and exchange-biased narrow-track MR sensors
Author :
Tsang, C. ; Fontana, R.E., Jr.
Author_Institution :
IBM Research, San Jose, CA
Volume :
18
Issue :
6
fYear :
1982
fDate :
11/1/1982 12:00:00 AM
Firstpage :
1149
Lastpage :
1151
Abstract :
We have designed, fabricated and tested 10μm × 15μm barber-pole biased unshielded MR sensors. Results show that strong domain activities, inherent in these small elements, produce noisy MR responses without any observable biasing effects. Furthermore, we found that these domains, caused by magnetostatic effects, can be suppressed by applying an adequate longitudinal bias field. These findings lead to the fabrication of MR sensors with longitudinal exchange-biasing and transverse barber-pole biasing. These sensors produce quiet and strongly biased MR responses.
Keywords :
Magnetoresistive transducers; Conductive films; Conductors; Fabrication; Geometry; Magnetic domains; Magnetic sensors; Magnetization; Magnetostatics; Sensor phenomena and characterization; Testing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1982.1061996
Filename :
1061996
Link To Document :
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