• DocumentCode
    989981
  • Title

    Fabrication and wafer testing of barber-pole and exchange-biased narrow-track MR sensors

  • Author

    Tsang, C. ; Fontana, R.E., Jr.

  • Author_Institution
    IBM Research, San Jose, CA
  • Volume
    18
  • Issue
    6
  • fYear
    1982
  • fDate
    11/1/1982 12:00:00 AM
  • Firstpage
    1149
  • Lastpage
    1151
  • Abstract
    We have designed, fabricated and tested 10μm × 15μm barber-pole biased unshielded MR sensors. Results show that strong domain activities, inherent in these small elements, produce noisy MR responses without any observable biasing effects. Furthermore, we found that these domains, caused by magnetostatic effects, can be suppressed by applying an adequate longitudinal bias field. These findings lead to the fabrication of MR sensors with longitudinal exchange-biasing and transverse barber-pole biasing. These sensors produce quiet and strongly biased MR responses.
  • Keywords
    Magnetoresistive transducers; Conductive films; Conductors; Fabrication; Geometry; Magnetic domains; Magnetic sensors; Magnetization; Magnetostatics; Sensor phenomena and characterization; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1982.1061996
  • Filename
    1061996