• DocumentCode
    990201
  • Title

    Losses in Armored Single-Conductor Lead-Covered A-C. Cables

  • Author

    Schurig, O.R. ; Kuehni, H.P. ; Buller, F.H.

  • Author_Institution
    General Electric Company, Schenectady, N. Y.
  • Volume
    48
  • Issue
    2
  • fYear
    1929
  • fDate
    4/1/1929 12:00:00 AM
  • Firstpage
    417
  • Lastpage
    434
  • Abstract
    The losses occurring in single-conductor armored cables whose sheath and armor are bonded and grounded at more than one point are¿besides the copper loss and the dielectric loss¿the circulating-current losses in the sheath and in the armor, and the additional iron losses in an armor of magnetic material. The circulating-current losses are due to the currents induced in the sheath and armor circuits by the fluxes linking these circuits when these circuits are closed by the bonds or grounding connections. Since the losses obtained in such cables are widely variable, depending on the cable design, both designers and operating engineers desire to know the loss magnitudes obtained in different cases and to have an understanding of the factors tending to give low losses. In this paper the sheath and armor losses have been analyzed for a steel-wire armored cable, a copper-wire armored cable, a steel-tape armored cable, and a cable enclosed in an iron pipe, and have been compared with the losses occurring in a plain lead-covered cable without armor. The data used include test data and calculated values. It is shown that a steel-wire armored 350,000-circular mil single-conductor copper cable with sheath and armor short circuited by low-impedance bonds had a total loss (exclusive of dielectric losses), of 2.8 times the conductor loss, by test in a single-phase 60-cycle circuit at 4 ft. cable spacing, at 260 amperes. The corresponding loss in a similar cable without armor, with lead sheath short circuited, was 2.4 times the conductor loss.
  • Keywords
    Bonding; Cables; Circuit testing; Conductors; Copper; Dielectric losses; Grounding; Iron; Joining processes; Magnetic materials;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1929.5055231
  • Filename
    5055231