Title :
On the generation of area-time optimal testable adders
Author :
Becker, Bernd ; Drechsler, Rolf ; Molitor, Paul
Author_Institution :
Dept. of Comput. Sci., Freiburg Univ., Germany
fDate :
9/1/1995 12:00:00 AM
Abstract :
We present a performance driven generator for integer adders which has the following interesting feature: The generator is parametrized in the operands´ bitlength n, the delay of the addition tn, and the fault model FM. FM may in particular be chosen as the classical stuck-at fault model, the cellular fault model or the robust path delay fault model. The output of the generator is a performance oriented conditional sum type adder, i.e., an area-minimal n-bit adder of the “conditional sum type” with delay ⩽tn (if it exists) together with a small complete test set with respect to the chosen fault model FM
Keywords :
adders; circuit layout CAD; circuit optimisation; computational complexity; design for testability; dynamic programming; fault diagnosis; integrated circuit layout; logic CAD; logic testing; area-time optimal adder generation; cellular fault model; conditional sum type adder; fault model; integer adders; performance driven generator; performance oriented adder; robust path delay fault model; stuck-at fault model; testable adders; Added delay; Adders; Circuit faults; Circuit testing; Computer science; Fault detection; Integrated circuit modeling; Integrated circuit testing; Logic; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on