DocumentCode :
990999
Title :
An oxidized porous silicon (OPS) microlens implemented on thick OPS membrane for a silicon-based optoelectronic-multichip module (OE-MCM)
Author :
Man-Lyun Ha ; Jae-Ho Kim ; Sung-Ku Yeo ; Young-Se Kwon
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejon, South Korea
Volume :
16
Issue :
6
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
1519
Lastpage :
1521
Abstract :
Using the silicon bulk micromachining and selectively oxidized porous silicon (SOPS) technology, a silicon dioxide microlens was implemented on thick oxidized porous silicon (OPS) membrane. Because the surface of microlens was the interface of OPS-Si, the surface roughness of lens was directly affected by the anodization current density, substrate resistivity, and high-frequency percent in ethanol-contained electrolyte. In the SOPS technology, the porous silicon layer (PSL) was formed under the mask layer with its horizontal-vertical ratio of about 0.8. During the formation of lens part, Si3N4 mask layer was also etched with constant etch rate and the PSL formed on the masked area was used as a membrane supporter. The initial open area and the thickness of the mask layer controlled the focal length of the OPS lens and its range was from 20 to 110 μm. By using these microlenses, a new silicon-based optoelectronic-multichip module configuration was proposed.
Keywords :
anodisation; current density; elemental semiconductors; etching; integrated optoelectronics; masks; microlenses; micromachining; multichip modules; oxidation; porous semiconductors; silicon; silicon compounds; surface roughness; 20 to 110 mum; Si; Si-Si; Si/sub 3/N/sub 4/; Si/sub 3/N/sub 4/ mask layer; anodization current density; etch rate; etching; ethanol-contained electrolyte; high-frequency percent; horizontal-vertical ratio; membrane supporter; oxidized porous silicon microlens; porous silicon layer; silicon bulk micromachining; silicon dioxide microlens; silicon-based optoelectronic-multichip module; substrate resistivity; surface roughness; thick OPS membrane; Biomembranes; Conductivity; Current density; Etching; Lenses; Micromachining; Microoptics; Rough surfaces; Silicon compounds; Surface roughness;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2004.827125
Filename :
1300651
Link To Document :
بازگشت