DocumentCode :
991657
Title :
Measurement of magnetocrystalline anisotropy field and magnetostriction coefficient in garnet films
Author :
Wang, X. ; Krafft, C.S. ; Kryder, M.H.
Author_Institution :
Carnegie-Mellon University, Pittsburgh, PA.
Volume :
18
Issue :
6
fYear :
1982
fDate :
11/1/1982 12:00:00 AM
Firstpage :
1295
Lastpage :
1297
Abstract :
We report here on improvements to standard techniques for the measurement of the effective uniaxial anisotropy field HKE= HK-4πMs, the magnetocrystalline anisotropy field H1, and the magnetostriction coefficient λ111. Measurements were made on full wafer garnets in a wideband resonance spectrometer with a nonresonant microstrip transmission line, Advantages of this technique include higher sensitivity than a previously reported microstrip structure [1], no problems with coupled resonances in λ111measurements, as was reported by Vella-Coleiro [2] with a shorted waveguide, and ability to measure H1on full wafer garnets, in contrast to use of a resonant cavity [3] which requires dicing the wafer into small chips. In the H1calculation, the deviation of the magnetization from the applied field direction is considered. Accuracy of H1is better than ±10 Oe. A graphical method for determining H1is presented. Results on different material compositions which support 1 μm and 0.5 μm diameter bubbles are reported.
Keywords :
Magnetic anisotropy; Magnetic bubble films; Anisotropic magnetoresistance; Garnet films; Magnetic anisotropy; Magnetic field measurement; Magnetic resonance; Magnetostriction; Microstrip; Perpendicular magnetic anisotropy; Semiconductor device measurement; Transmission line measurements;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1982.1062154
Filename :
1062154
Link To Document :
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