• DocumentCode
    992028
  • Title

    Reliability block diagram simulation techniques applied to the IEEE Std. 493 standard network

  • Author

    Wang, Wendai ; Loman, James M. ; Arno, Robert G. ; Vassiliou, Pantelis ; Furlong, Edward R. ; Ogden, Doug

  • Author_Institution
    GE Global Res. Center, Niskayuna, NY, USA
  • Volume
    40
  • Issue
    3
  • fYear
    2004
  • Firstpage
    887
  • Lastpage
    895
  • Abstract
    This is one of a series of papers discussing the application and accuracy of different analysis techniques supporting the determination of industrial and commercial power system reliability and availability. There is a need recognized in the power industry to identify and utilize a standard tool, or a set of tools, to analyze the reliability of power systems. Historically, the results of applying different reliability methodologies and tools varied significantly, and comparisons were difficult. The Reliability Analysis Techniques Working Group of the Gold Book (IEEE Std. 493-1997) developed a standard network to enable comparison of analytical techniques. This paper describes the approach of simulations via reliability block diagrams as applied to the Gold Book standard network. Reliability indexes of the load points are presented, and are compared with ones obtained from other techniques in the series to determine the accuracy.
  • Keywords
    IEEE standards; industrial power systems; power system reliability; power system simulation; IEEE Std. 493 standard network; commercial power system; industrial power system; power industry; power system availability; power system reliability; reliability block diagram simulation techniques; Availability; Books; Gold; Industrial power systems; Modeling; Power cables; Power system analysis computing; Power system reliability; Power system simulation; Reliability engineering; Availability; industrial; interruptions; network reliability; power system; reliability; simulations;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2004.827805
  • Filename
    1300744