DocumentCode :
992111
Title :
A new vertical IGBT structure with a monolithic over-current, over-voltage, and over-temperature sensing and protecting circuit
Author :
Iwamuro, N. ; Harada, Y. ; Yamazaki, T. ; Kumagai, N. ; Seki, Y.
Author_Institution :
Adv. Device Technol. Lab., Fuji Electr. Corp. R&D Ltd., Nagano, Japan
Volume :
16
Issue :
9
fYear :
1995
Firstpage :
399
Lastpage :
401
Abstract :
A new 600 V vertical Insulated Gate Bipolar Transistor (IGBT) structure with monolithically integrated over-current, over-voltage, and over-temperature sensing and protecting functions has been developed to exploit an extremely excellent trade-off characteristic between an on-state voltage drop and turn-off time for the first time. This device can be easily made by the conventional IGBT fabrication process. An accurate and a real-time device temperature detection, as well as a high withstand capability against over-current and over-voltage conditions (short circuit immunity of 30 μsec, clamped collector voltage of 640 V), have been achieved. Furthermore, an excellent trade-off characteristic of 1.40 V as an on-state voltage drop and of 0.18 μsec as a fall time is also obtained.
Keywords :
insulated gate bipolar transistors; overcurrent protection; overvoltage protection; protection; temperature sensors; 600 V; clamped collector voltage; fabrication; fall time; insulated gate bipolar transistor; monolithic circuit; on-state voltage drop; over-current; over-temperature; over-voltage; protecting circuit; real-time device temperature detection; sensing circuit; short circuit immunity; turn-off time; vertical IGBT; Displays; Fabrication; Failure analysis; Insulated gate bipolar transistors; Insulation; Power integrated circuits; Protection; Temperature sensors; Thyristors; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.406801
Filename :
406801
Link To Document :
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