DocumentCode
992145
Title
Fabrication and characteristics of ion-implanted GaAs/GaAlAs integrated injection logic inverter
Author
Narozny, P. ; Beneking, H.
Author_Institution
Aachen Technical University, Institute of Semiconductor Electronics, Aachen, West Germany
Volume
20
Issue
11
fYear
1984
Firstpage
442
Lastpage
443
Abstract
An integrated injection logic inverter has been realised in GaAs/GaAlAs material using ion implantation and Zn diffusion. Si ions have been implanted to merge the current source with the switching transistor, whereas the Be implantation provides the base contact. The shallow p+-emitter of the pnp current source has been fabricated by Zn diffusion. Instead of a lateral pnp transistor, which is typical in I2L technology, a vertical arrangement has been used. This type of transistor shows a better current efficiency and can be fabricated with a better uniformity in terms of base width. First results of an I2L inverter with a vertical pnp transistor are shown.
Keywords
III-V semiconductors; aluminium compounds; beryllium; bipolar integrated circuits; gallium arsenide; integrated circuit technology; integrated injection logic; invertors; ion implantation; silicon; zinc; Be implantation; GaAs/GaAlAs; I2L inverter; I2L technology; IC technology; Si implantation; Zn diffusion; base contact; characteristics; current efficiency; current source; fabrication; integrated injection logic inverter; ion implantation; logic inverter; semiconductors; switching transistor; vertical pnp transistor;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19840307
Filename
4248762
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