• DocumentCode
    992145
  • Title

    Fabrication and characteristics of ion-implanted GaAs/GaAlAs integrated injection logic inverter

  • Author

    Narozny, P. ; Beneking, H.

  • Author_Institution
    Aachen Technical University, Institute of Semiconductor Electronics, Aachen, West Germany
  • Volume
    20
  • Issue
    11
  • fYear
    1984
  • Firstpage
    442
  • Lastpage
    443
  • Abstract
    An integrated injection logic inverter has been realised in GaAs/GaAlAs material using ion implantation and Zn diffusion. Si ions have been implanted to merge the current source with the switching transistor, whereas the Be implantation provides the base contact. The shallow p+-emitter of the pnp current source has been fabricated by Zn diffusion. Instead of a lateral pnp transistor, which is typical in I2L technology, a vertical arrangement has been used. This type of transistor shows a better current efficiency and can be fabricated with a better uniformity in terms of base width. First results of an I2L inverter with a vertical pnp transistor are shown.
  • Keywords
    III-V semiconductors; aluminium compounds; beryllium; bipolar integrated circuits; gallium arsenide; integrated circuit technology; integrated injection logic; invertors; ion implantation; silicon; zinc; Be implantation; GaAs/GaAlAs; I2L inverter; I2L technology; IC technology; Si implantation; Zn diffusion; base contact; characteristics; current efficiency; current source; fabrication; integrated injection logic inverter; ion implantation; logic inverter; semiconductors; switching transistor; vertical pnp transistor;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19840307
  • Filename
    4248762