• DocumentCode
    992275
  • Title

    Estimation of the peak power density in the vicinity of cellular and radio base station antennas

  • Author

    Cicchetti, Renato ; Faraone, Antonio

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Rome "La Sapienza", Italy
  • Volume
    46
  • Issue
    2
  • fYear
    2004
  • fDate
    5/1/2004 12:00:00 AM
  • Firstpage
    275
  • Lastpage
    290
  • Abstract
    Prediction formulae for estimating the peak equivalent power density in the near-field of cellular base-station array antennas are demonstrated. Theoretical justification stemming from a uniform asymptotic expansion of the field radiated by collinear arrays is described, and verification is carried out by means of an extensive computational analysis of different classes of base station antennas. The formulae, which depend on a few, readily available parameters, can be conveniently employed for the estimation of compliance distances with respect to RF safety guidelines issued by the International Committee on Non-Ionizing Radiation Protection (ICNIRP), which have been adopted in many countries throughout the world, without requiring necessarily extensive and expensive nearfield measurements campaigns.
  • Keywords
    antenna arrays; cellular radio; densitometry; electromagnetic wave propagation; radiation protection; International Committee on Nonionizing Radiation Protection; RF safety guidelines; cellular vicinity; collinear arrays; electromagnetic energy exposure; near-field propagation; peak power density estimation; prediction formulae; radio base station array antennas; radiofrequency densitometry; uniform asymptotic expansion; Antenna arrays; Base stations; Electromagnetic measurements; Guidelines; Humans; Laboratories; Magnetic field measurement; Protection; Radiation safety; Radio frequency; Array antennas; EME; electromagnetic energy; exposure; near-field propagation; radio base station; radio-frequency densitometry;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2004.826885
  • Filename
    1300767