• DocumentCode
    992528
  • Title

    Comments on "A theoretical and numerical analysis of the measured equation of invariance"

  • Author

    Mei, Kenneth K. ; Liu, Yaowu

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, Hong Kong
  • Volume
    43
  • Issue
    10
  • fYear
    1995
  • Firstpage
    1168
  • Lastpage
    1171
  • Abstract
    In the original paper (see ibid., vol.42, no.8, p.1097-1105, 1994), the authors claimed to have found theoretical insights into the measured equations of invariance (MEI) method. Their first insight was a proof that the postulate of invariance was wrong, and their second insight led to the discovery of an optimum set of metrons. Metrons are considered to be "possible" induced current densities due to some unknown incident fields. They also presented a series of computational results to highlight their theories. This article points out the defects in the analyses and conclusions presented by the authors. There are two things in the paper which are basically incorrect. One is that the authors consider a zero in a numerical formulation to be an absolute zero. The other is that they assume the "invariance to excitations" to be the same as the "invariance to metrons". Based on these assumptions, they have reached conclusions which are actually contradictory to their own calculations. This article shows where the defects of their analyses occur and why their two insights are contradictory to each other.<>
  • Keywords
    current density; electromagnetic fields; electromagnetic induction; numerical analysis; absolute zero; excitations invariance; incident fields; induced current densities; measured equation of invariance; metrons invariance; numerical analysis; optimum metrons; theoretical analysis; Antennas and propagation; Cities and towns; Difference equations; Finite difference methods; Finite element methods; Numerical analysis; Partial differential equations;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.467658
  • Filename
    467658