Title :
Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan
Author :
Boyer, A. ; Bendhia, S. ; Sicard, E.
Author_Institution :
Electron. Dept., Toulouse
Abstract :
A susceptibility characterisation test for integrated circuits using a miniature magnetic near-field probe is described. The method is efficient up to a frequency of 6 GHz and maps immunity to radiated fields
Keywords :
immunity testing; integrated circuit testing; probes; electromagnetic susceptibility; integrated circuits; magnetic near-field probe; near-field scan; radiated fields immunity; susceptibility characterisation test;
Journal_Title :
Electronics Letters
