DocumentCode
992766
Title
Functional Pixel Circuits for Elastic AMOLED Displays
Author
Servati, Peyman ; Nathan, Arokia
Author_Institution
Ignis Innovation Inc., Waterloo, Ont., Canada
Volume
93
Issue
7
fYear
2005
fDate
7/1/2005 12:00:00 AM
Firstpage
1257
Lastpage
1264
Abstract
While fabrication of active matrix organic LED (AMOLED) displays on plastic substrates continues to face technological challenges, stable electrical operation of thin-film transistor (TFT) pixel circuits under mechanical stress induced by substrate bending remains a critical issue. This paper investigates strain-induced shifts in hydrogenated amorphous silicon TFT characteristics and the compound impact on TFT circuit behavior. Measurements show that the magnitude of the shifts is determined by the direction of current flow in the TFT with respect to the bending stress orientation as well as bias conditions. Physically based compact models are developed that relate device characteristics to material behavior for design and optimization of AMOLED pixel circuits that can maintain immunity to bending stress. In particular, current mirror-based pixel circuits are presented that compensate for the long term threshold voltage shift and instantaneous strain-induced shifts in device characteristics.
Keywords
LED displays; amorphous semiconductors; bending; elemental semiconductors; organic light emitting diodes; plastics; silicon; stress effects; thin film circuits; thin film transistors; AMOLED display; TFT circuit; active matrix organic LED display; amorphous silicon; bending stress orientation; current mirror; flexible displays; mechanical stress; pixel circuit; plastic substrate; strain gauges; strain-induced shifts; substrate bending; thin-film transistor; threshold voltage shift; Active matrix organic light emitting diodes; Active matrix technology; Circuits; Displays; Fabrication; Light emitting diodes; Plastics; Stress; Substrates; Thin film transistors; Active matrix organic LED (AMOLED); Amorphous silicon (a-Si : H); flexible displays; mechanical stress; pixel circuit; strain gauges; thin-film transistor (TFT) backplane; threshold voltage shift;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2005.851534
Filename
1461581
Link To Document