DocumentCode :
992979
Title :
On resonant tunneling in Nb-Nb2O5-diodes
Author :
Halbritter, J.
Author_Institution :
Institut für Kernphysik, Karlsruhe, Federal Republic of Germany
Volume :
19
Issue :
3
fYear :
1983
fDate :
5/1/1983 12:00:00 AM
Firstpage :
799
Lastpage :
802
Abstract :
In Nb2O5adjacent (≤ 5 nm) to a metal, the hybridization of localized electrons with conduction electrons yields interface states, which exist up to the Fermi energy EFof the metal. These interface states can be classified in 2 groups: -Localized electrons between 1 and 5 nm in front of Nb have a long decay life time into the metal, so that exchange processes via these interface states are obstructed and show a correlation (image potential) energy ΔUx> 5 meV. -Adjacent to the metal (< 1 nm) exchange processes without ΔUxare possible. Thus an electric field is already shielded in front of the metal and such interface states are weakly superconducting. These interface states yield a resonant tunnel current which cannot be fitted by direct barrier tunneling and which is exponentially enhanced over direct tunneling, yielding: -A strong, symmetric increase of the tunnel current, above 10-40 meV (giant zero bias anomaly: GZBA). -Josephson and leakage currents and smearing out of structures in the tunnel current at voltages between 0 and 20 meV.
Keywords :
Diodes; Niobium materials/devices; Superconducting devices; Tunnel effect; Amorphous materials; Dielectrics; Diodes; Electrons; Interface states; Leakage current; Niobium compounds; Resonant tunneling devices; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1983.1062275
Filename :
1062275
Link To Document :
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