• DocumentCode
    992979
  • Title

    On resonant tunneling in Nb-Nb2O5-diodes

  • Author

    Halbritter, J.

  • Author_Institution
    Institut für Kernphysik, Karlsruhe, Federal Republic of Germany
  • Volume
    19
  • Issue
    3
  • fYear
    1983
  • fDate
    5/1/1983 12:00:00 AM
  • Firstpage
    799
  • Lastpage
    802
  • Abstract
    In Nb2O5adjacent (≤ 5 nm) to a metal, the hybridization of localized electrons with conduction electrons yields interface states, which exist up to the Fermi energy EFof the metal. These interface states can be classified in 2 groups: -Localized electrons between 1 and 5 nm in front of Nb have a long decay life time into the metal, so that exchange processes via these interface states are obstructed and show a correlation (image potential) energy ΔUx> 5 meV. -Adjacent to the metal (< 1 nm) exchange processes without ΔUxare possible. Thus an electric field is already shielded in front of the metal and such interface states are weakly superconducting. These interface states yield a resonant tunnel current which cannot be fitted by direct barrier tunneling and which is exponentially enhanced over direct tunneling, yielding: -A strong, symmetric increase of the tunnel current, above 10-40 meV (giant zero bias anomaly: GZBA). -Josephson and leakage currents and smearing out of structures in the tunnel current at voltages between 0 and 20 meV.
  • Keywords
    Diodes; Niobium materials/devices; Superconducting devices; Tunnel effect; Amorphous materials; Dielectrics; Diodes; Electrons; Interface states; Leakage current; Niobium compounds; Resonant tunneling devices; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1983.1062275
  • Filename
    1062275