DocumentCode
992979
Title
On resonant tunneling in Nb-Nb2 O5 -diodes
Author
Halbritter, J.
Author_Institution
Institut für Kernphysik, Karlsruhe, Federal Republic of Germany
Volume
19
Issue
3
fYear
1983
fDate
5/1/1983 12:00:00 AM
Firstpage
799
Lastpage
802
Abstract
In Nb2 O5 adjacent (≤ 5 nm) to a metal, the hybridization of localized electrons with conduction electrons yields interface states, which exist up to the Fermi energy EF of the metal. These interface states can be classified in 2 groups: -Localized electrons between 1 and 5 nm in front of Nb have a long decay life time into the metal, so that exchange processes via these interface states are obstructed and show a correlation (image potential) energy ΔUx> 5 meV. -Adjacent to the metal (< 1 nm) exchange processes without ΔUxare possible. Thus an electric field is already shielded in front of the metal and such interface states are weakly superconducting. These interface states yield a resonant tunnel current which cannot be fitted by direct barrier tunneling and which is exponentially enhanced over direct tunneling, yielding: -A strong, symmetric increase of the tunnel current, above 10-40 meV (giant zero bias anomaly: GZBA). -Josephson and leakage currents and smearing out of structures in the tunnel current at voltages between 0 and 20 meV.
Keywords
Diodes; Niobium materials/devices; Superconducting devices; Tunnel effect; Amorphous materials; Dielectrics; Diodes; Electrons; Interface states; Leakage current; Niobium compounds; Resonant tunneling devices; Temperature; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1983.1062275
Filename
1062275
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