Title :
Imaging of objects in a halfspace with unknown permittivity
Author_Institution :
Bergische Universitÿt Wuppertal, Gesamthochschule Fachbereich 13, Elektrotechnik, Wuppertal, West Germany
Abstract :
A method for the imaging of objects imbedded in a dielectric halfspace of unknown permittivity is presented. For this a synthetic aperture technique with a new `focusing condition¿ is utilised.
Keywords :
focusing; microwave measurement; nondestructive testing; picture processing; NDT; dielectric halfspace; focusing condition; imbedded object; microwave imaging; nondestructive testing; picture processing; synthetic aperture technique; unknown permittivity;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840395
