• DocumentCode
    993184
  • Title

    The two-dimensional inverse scattering problem

  • Author

    Imbriale, William A. ; Mittra, Raj

  • Author_Institution
    TRW Systems Group, Redondo Beach, CA, USA
  • Volume
    18
  • Issue
    5
  • fYear
    1970
  • fDate
    9/1/1970 12:00:00 AM
  • Firstpage
    633
  • Lastpage
    642
  • Abstract
    It is demonstrated that the knowledge of the incident field and the scattered far fields at one frequency may be employed to determine the size, shape, and location of a perfectly conducting scatterer. The reconstruction of the scattering body is accomplished via an analytic continuation procedure that generates the fields in the neighborhood of the scatter from the specified far-field distribution. The geometry of the body is then determined by locating a closed surface for which the total tangential electric field, i.e., the sum of the tangential components of the incident and scattered field, is zero. Whereas exact knowledge of the entire far field is sufficient to determine the scatterer, a technique is also given for size and shape determination when only part of the far field is available. Numerical examples of several different geometries are given for ranges of ka (a the largest dimension of the body) from 0.2 to 10. Geometries considered were elliptic and circular cylinders, conducting strips, and two cylinders. Plots of the fields reconstructed from the far-field data are compared to the known solutions, and the accuracy of the procedure is demonstrated. The effects of noise in the far-field pattern is also considered, and it is shown that even with noise levels of -20 dB the scattering geometry can be recovered.
  • Keywords
    Electromagnetic scattering, inverse problem; Antennas and propagation; Electromagnetic scattering; Geometry; Inverse problems; Light scattering; Optical scattering; Physics; Radar scattering; Rayleigh scattering; Shape;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1970.1139769
  • Filename
    1139769