DocumentCode :
993755
Title :
HX2: a 16-channel charge amplifier IC for the read-out of X-ray detectors
Author :
Thomas, S.L. ; Seller, P. ; Sharp, P H
Author_Institution :
Rutherford Appleton Lab., Chilton, UK
Volume :
42
Issue :
4
fYear :
1995
fDate :
8/1/1995 12:00:00 AM
Firstpage :
830
Lastpage :
834
Abstract :
RAL Microelectronics Group has developed a 16-channel multiplexed charge amplifier IC (HX2) for the read-out of cadmium telluride X-ray detectors. The IC has been incorporated into a prototype X-ray imaging system intended for non-destructive production line monitoring. The HX2 contains an array of 16 integrating amplifiers, each with a 10 pF feedback capacitor, and a dynamic range of 20 pC. The integration period can be varied over the range ~5 μs to ~100 ms. In order to extend its range of applications, HX2 was designed with two modes of operation. In the first mode, the integration period is followed by the read-out period where the 16 channels are multiplexed onto an analogue output bus. The next integration period starts when this read-out has finished. In the second mode, the read-out of the voltages from one integration period takes place during the subsequent integration period. This overlapping of integration and read-out periods reduces the dead time of the HX2. The IC has a signal-to-noise ratio which is typically above 10000:1, and is suitable for the high-resolution read-out of other detector systems, such as photodiode arrays. The dual-mode operation allows it to work with detectors producing either continuous or pulsed currents
Keywords :
CMOS analogue integrated circuits; II-VI semiconductors; X-ray detection; X-ray imaging; cadmium compounds; detector circuits; instrumentation amplifiers; nuclear electronics; operational amplifiers; semiconductor counters; 10 pF; CdTe; HX2 16-channel charge amplifier IC; X-ray detector readout; analogue output bus; continuous currents; dead time reduction; dual-mode operation; dynamic range; feedback capacitor; integrating amplifiers; integration period; multiplexed charge amplifier IC; nondestructive production line monitoring; photodiode arrays; prototype X-ray imaging system; pulsed currents; signal-to-noise ratio; Cadmium compounds; Capacitors; Dynamic range; Feedback; Microelectronics; Monitoring; Production systems; Prototypes; X-ray detectors; X-ray imaging;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.467784
Filename :
467784
Link To Document :
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