Title :
Power distribution in a Josephson package environment
Author :
Arnett, Patrick C.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, New York
fDate :
5/1/1983 12:00:00 AM
Abstract :
An ac power supply designed to power 8K Josephson logic circuits has been tested in a package environment for the first time. The test was part of an experiment that utilized the essential package components for a Josephson computer. All accessible chip-level power signals had the predicted amplitude variation with frequency over the range 50-400 MHz when normal fabrication tolerances were taken into account. This power supply, with reduced loading to accommodate some lines with unexpectedly low critical currents, was used to power the logic circuits in a path representative of a critical path for a proposed prototype processor. A minimum cycle time of 3.7 ns was achieved.
Keywords :
Computer power supplies; Josephson device logic circuits; Packaging; Circuit testing; Critical current; Fabrication; Frequency; Josephson junctions; Logic circuits; Logic testing; Packaging; Power distribution; Power supplies;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062351