Title :
Return Field-Induced Partial Erasure in Perpendicular Recording Using Trailing-Edge Shielded Writers
Author :
Bai, Daniel Z. ; Luo, Peng ; Torabi, Adam ; Terrill, Dave ; Wang, James ; Stoev, Kroum ; Liu, Francis ; Moneck, Matthew ; Tang, Yuhui ; Zhu, Jian-Gang
Author_Institution :
Western Digital Corp., Fremont, CA
Abstract :
Return field-induced partial erasure (RFPE) in trailing-edge shielded perpendicular writers has been studied, both by modeling and by experiments. For a given head-media combination, the return field underneath the trailing shield increases with increasing write current. Once exceeding a certain threshold, it will cause partial erasure of the bits that have just been written by the main pole. Recording performance, such as reverse overwrite, spectral signal-to-noise ratio, and bit-error rate are all found degraded at high write currents, due to RFPE. Design optimization of both head and media together is needed, in order to maximize the advantage of a trailing-edge shielded pole head and minimize the impact of RFPE
Keywords :
error statistics; magnetic heads; magnetic shielding; perpendicular magnetic recording; bit-error rate; design optimization; head-media combination; perpendicular recording; return field-induced partial erasure; spectral signal-to-noise ratio; trailing-edge shielded writers; Bit error rate; Data storage systems; Degradation; Design optimization; Digital recording; Finite element methods; Magnetic heads; Magnetization; Perpendicular magnetic recording; Signal to noise ratio; Partial erasure; perpendicular recording; return field; shielded pole head;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.888198