• DocumentCode
    993895
  • Title

    Monolithic cryogenic preamplifiers based on large gate-area GaAs MESFETs

  • Author

    Camin, D.V. ; Fedyakin, N. ; Pessina, G. ; Previtali, E.

  • Author_Institution
    Dipartimento di Fisica, Milan Univ., Italy
  • Volume
    42
  • Issue
    4
  • fYear
    1995
  • fDate
    8/1/1995 12:00:00 AM
  • Firstpage
    758
  • Lastpage
    761
  • Abstract
    Monolithic preamplifiers using large gate-area Gallium-Arsenide Metal-Semiconductor Field-Effect Transistors (GaAs MESFETs) at the input have been designed and fabricated using an ion-implanted GaAs process. Large gate-area is necessary to obtain low series noise. A differential voltage-sensitive preamplifier has at the input two MESFETs with a gate width W=6000 μm, it is fully DC coupled, has a large common-mode rejection ratio (CMRR) and dissipates low power at 4 K. Dual current-sensitive preamplifiers using at the input MESFETs with W=24000 μm, designed for the readout of noble liquid calorimeters, have been integrated in a single chip. Recent tests with a LAr calorimeter prototype demonstrated strong noise reduction compared to previous state-of-the-art hybrid readout circuits. Radiation damage tests have been performed at cold on the current-sensitive preamplifier chips
  • Keywords
    III-V semiconductors; MESFET integrated circuits; cryogenic electronics; detector circuits; differential amplifiers; field effect analogue integrated circuits; gallium arsenide; nuclear electronics; preamplifiers; radiation effects; radiation hardening (electronics); semiconductor counters; 4 K; GaAs; common-mode rejection ratio; current-sensitive preamplifier chips; differential voltage-sensitive preamplifier; dual current-sensitive preamplifiers; ion-implanted GaAs process; large gate-area GaAs MESFETs; liquid argon calorimeter prototype; metal-semiconductor field-effect transistors; monolithic cryogenic preamplifiers; noise reduction; radiation damage tests; state-of-the-art hybrid readout circuits; Circuit testing; Cryogenics; FETs; Gallium arsenide; MESFETs; Noise reduction; Performance evaluation; Preamplifiers; Prototypes; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.467796
  • Filename
    467796